ABSTRACT:
Microscopy is a technique for making very small things visible to the unaided eye. An instrument used to make the small things visible to the naked (unaided) eye is called a microscope. Scanning electron microscopy is discussed in light of its principles, advantages, and applications. Comparisons of this system are made with the light microscopic and transmission electron systems. A cross section of pertinent literature on the scanning electron microscope, its development and use, has been integrated into the initial sections to provide a reference base for this general field. A detailed literature view on the use of this system in the field of wood science has also been included.
Cite this article:
Ravi Kumar. Microscopy, Working and Types. Asian Journal of Pharmacy and Technology. 2021; 11(3):245-8. doi: 10.52711/2231-5713.2021.00040
Cite(Electronic):
Ravi Kumar. Microscopy, Working and Types. Asian Journal of Pharmacy and Technology. 2021; 11(3):245-8. doi: 10.52711/2231-5713.2021.00040 Available on: https://ajptonline.com/AbstractView.aspx?PID=2021-11-3-10
REFERENCES:
1. Goldstein JI, Yakowitz H. Newbury, DE Lifshin E. Colby JW. Coleman. 1975. Pratical Scanning Electron Microscopy: Electron and Ion Microprobe Analysis.
2. Loretto MH 1984. Electron Beam Analysis of Materials, in Chapman and Hall, London New York FEI. The Quanta 200 User’s Operation Manual 2nd ed. (2004). I.M. Watt, The Principles and Practice of Electron Microscopy, (Cambridge Univ. Press. Cambridge, England, 1985.
3. Lyman CE, Newbury DE, Goldstein JI, Williams DB, Romig AD, Armstrong JT, Echlin P, Fiori CE, Joy DC, Lifshin E, Peters KR, 1990 Scanning Electron Microscopy X-Ray Microanalysis and Analytical Electron Microscopy: A Laboratory Workbook, Press. New York, N.Y.
4. Postek MT, Howard KS, Johnson AH, McMichael KL. 1980. Scanning Electron Microscopy: A Student’s Handbook, (Ladd Research Ind., Inc. Williston, VT).
5. Eicixen E, Fitchmun DR, Sefton LR. 1969. Interpretation of micrographs from a scanning electron microscope.
6. Proc., 27th Ann. Meeting, Electron Microscopy Society of America (C. J. Arceneaux ed.). Claitors' Publishing Division, Baton Rouge, p. 22-23. Everhart, E. 1958. Contrast formation in the scanning electron microscope. Ph.D. Dissertation. University of Cambridge (England).
7. Smith A, Wells OC, Oatle CW, 1960. Recent developments in scanning electron microscopy. Vierter Internationater Kongress Fur Elektronen-mikroskopie (Herausgegeben von 6. Mollenstedt, H. Niehrs, and E. Ruska). Band I, p. 269- 273.
8. Springer-Verlag, Berlin (in English)., 0. C. Wells, C. W. Oatley 1959. Factors affecting contrast and resolution in the scanning electron microscope. J. Electronics and Control, 7(2): 97-111. Fengel, D. 1967. Ultramicrotomy, its applications in wood research. Wood Science and Technology, l(3) : 191-204.
9. Findlay GWD, Levy JF. 1969. Scanning electron microscopy as an aicl to the study of wood anatomy and decay. J. Inst. Wood Science, 4(5): 57-63.
10. Forgacs 0L. 1963. The characterization of mechanical pulps. Pulp and Paper Magazine of Canada (Convention Issue), 64. (C): T89- T118.
11. Fujiyasu Tk, Tilwura, H. 1968. Hitachi scanning electron microscope. Proc., 26th Ann. Meeting, Electron Microscopy Society of America (C. J. Arceneaux, ed.). Clai- 132 Bernard M. Collett tors' Publishing Division, Baton Rouge, p. 374- 375.
12. Hall CE 1966. Introduction to electron microscopy. 2nd ed. McGraw-Hill Book Co., New York. 397 p.
13. Hay WW, Sandberg PA. 1967. The scanning electron microscope, a major breakthrough for micropaleontology. Micropaleontology, 13(4): 407418.
14. Hayes TL, Pease RFW. 1968. The scanning electron microscope: principles and applications in biology and medicine. Ad- vances in biological ancl medical physics. v. 12, p. 85-137.
15. Jensen WA, Park RB 1967. Cell ultrastructure. Wadsworth Publishing Company, Inc., Belmont, California. 60 p. KAY, D. H. 1965.
16. Techniques for electron microscopy. 2nd ed. F. A. Davis Co., Philadelphia. 560 p. KIMOTO, S. 1967.
17. On a scanning electron microscope. Bulletin No. SM-67013. Japan Electron Optics Laboratory Co., Ltd., Tokyo, Japan. 15 p.
18. Philip D. Rack, on “Optical Microscopy”, Dept. of Materials Science and Engineering University of Tennessee & lecture was generated by Professor James Fitz-Gerald at the University of Virginia.
19. Gabriel Popescu, “Chapter 4. Principles of Optical Imaging” Electrical and Computer Engineering, University of Illinois at Urbana‐Champaign, Beckman Institute Quantitative Laboratory, Light Imaging http://light.ece.uiuc.edu
20. Text of Microbiology web sitehttps://www.ikbooks.com/ home/sample chapter? filename=147_Sample-Chapter.pdf 7.
21. Khangaonkar PR 2010. “An Introduction to material characterization”, Penram Int. publishing pvt. Ltd. ISBN978-81-87972-80-8.
22. Doug, Holly & Oleg, “SEM Microscope”. 10. M.T. Postek, K.S. Howard, A.H. Johnson and K.L. McMichael, Scanning Electron Microscopy: A Student’s Handbook, (Ladd Research Ind., Inc Williston, VT., 1980).
23. Watt IM, The Principles and Practice of Electron Microscopy, (Cambridge Univ. Press. Cambridge, England, 1985).
24. Lyman CE, Newbury DE, Goldstein JI, Williams DB, Romig AD, Armstrong JT, Echlin P, Fiori CE, Joy DC, Lifshin E, Peters KR, Scanning Electron Microscopy, X-Ray Microanalysis and Analytical Electron Microscopy: A Laboratory Workbook, (Plenum Press. New York, N.Y., 1990).
25. From Scanning Electron Microscopy and X-Ray Microanalysis, Joseph I. Goldstein, Plenum Press.
26. All the remaining figures are taken from google.com website.
27. Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences) by Ludwig Reimer and P.W. Hawkes (Hardcover - Oct 16, 1998)
28. A Guide to X-Ray Microanalysis, Oxford Microanalytical Instruments.
29. A Transmission Electron Microscope is anologous to a slide projector as indicated by Philips.